德***Sentech光伏測量儀器MDPspot，靈活的自動(dòng)掃描系統

 

具有成本效益的臺式少子壽命測試儀MDPspot可用于表征晶片或面。它為少子壽命測量提供了***個(gè)測量點(diǎn)。

 

低成本桌面式壽命測量系統，用于手動(dòng)操作表征不同制備階段的各種不同硅樣品?？蛇x的手動(dòng)操作Z軸用于厚度多達156毫米的樣品。標準軟件可輸出可視化的測量結果。

 

MDPspot包括附加電阻率測量選項。只測量硅的電阻，對于沒(méi)有高度調節可能性的晶片，或者對于磚。這兩個(gè)選項中的***個(gè)必須是預先定義的。

 

優(yōu)勢

。用于單點(diǎn)測量少子壽命的臺式裝置，可測量多晶或單晶硅在不同制備階段，從成長(cháng)到后面器件。
。體積小，成本低，使用方便。附帶***個(gè)基本軟件，用于在小型電腦或筆記本上輸出可視化的測量結果。
。適用于晶片上的磚，易于進(jìn)行高度調整。

MDPspot flexible automatic scanning system

 

The cost - effective desktop low - child - life tester MDPspot can be used to characterize chips or surfaces.It provides a measuring point for measuring the life span of children.

 

Low cost desktop life measurement system for manual characterization of various silicon samples at different preparation stages.The optional manually operated z-axis is used for samples up to 156 mm thick.Standard software can output visual measurement results.

 

 

MDPspot includes additional resistivity measurement options.Only the electrical resistance of silicon is measured, either for wafers with no possibility of high regulation, or for bricks.One of the two options must be predefined.