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回收E6607C 無(wú)線(xiàn)測試儀

價(jià)  格:詢(xún)價(jià)

產(chǎn)  地:廣東 東莞市更新時(shí)間:2025-02-13 10:04

品  牌:其他型  號:

狀  態(tài):正常點(diǎn)擊量:2320

400-006-7520
聯(lián)系我時(shí),請說(shuō)明是在上海非利加實(shí)業(yè)有限公司上看到的,謝謝!

上海非利加實(shí)業(yè)有限公司

聯(lián) 系 人: 上海非利加實(shí)業(yè)有限公司

電   話(huà): 400-006-7520

傳   真: 400-006-7520

配送方式: 上海自提或三方快遞

聯(lián)系我時(shí)請說(shuō)在上海非利加實(shí)業(yè)有限公司上看到的,謝謝!




產(chǎn)品參數


產(chǎn)品介紹

E6607C【肖曉:13377777186】 EXT Multiport Wireless Communications Test Set

回收安捷倫E6607C_二手E6607C_收購二手E6607C

客服QQ:2090529353
地址:東莞市塘廈鎮花園中心

回收閑置儀器-沒(méi)有十全十美的產(chǎn)品,有百分之百的服務(wù)

全程優(yōu)質(zhì)服務(wù),歡迎來(lái)電13377777186咨詢(xún)!

主要特性與技術(shù)指標
Integrated Multiport enables efficient Multi-DUT test
Integrated multiport provides for parallel receiver test / fast switched transmitter test making effective use of test equipment resources
Lower cost, smaller footprint, lower power consumption verses use of external multiport adapter
Fully compatible with software written for E6607A / E6607B for seamless integration in manufacturing
Add external display, mouse, and keyboard, for full manual control and functionality equivalent to E6607B & MPA
Anticipate your wireless device manufacturing test needs
Benefit from an architecture that is optimized for lower-cost next generation non-signaling test
Add multi-format standards-based calibration and verification test support as needed for LTE TDD/FDD, HSPA+, W-CDMA, 1xEV-DO, cdma2000?, GSM, EDGE-Evo, TD-SCDMA, WiMAXTM, Bluetooth?, GPS/GNSS, and more
Ensure your test system is future proof due to its modern, scalable architecture
Accelerate test development
Ensure seamless transition from NPI to production with proven X-Series analyzer measurements science
Simplify signal creation to synchronize, control, and test your wireless device with Signal Studio software
Streamline test plan creation and troubleshooting in a graphical interface with Sequence Studio software
Reduce time to volume manufacturing with Chipset Software to optimize device calibration and verification
Achieve fast and accurate measurements
Maximize throughput with fast-sequenced, non-signaling test modes for modern chipsets
Speed up your test plan in sequence analyzer mode with single acquisition, multiple measurements
Increase your production yield with superior measurement accuracy
Cost effective integrated Multiport Adapter with metrology grade precision and balancing


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